IEEE

Design and Optimization of ESD Protection Structure Triggered by Polysilicon Diode for Low- and Medium-Voltage ICs

Abstract: A novel silicon-controlled rectifier (SCR) triggered by multiple polysilicon diodes (MPDTSCR) is proposed and investigated for electrostatic discharge (ESD) protection in low- and ...
IEEE

Impact of Strain on Sub-3 nm Gate-All-Around CMOS Logic Circuit Performance Using a Neural Compact Modeling Approach

Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...
Daily Reporter

2026 NEC clarifies use of 10-amp branch circuits

In the 2023 National Electrical Code a permissive rule introduced a new branch circuit rating of 10 amperes. This has raised some questions about what size conductor would be required and where the 10 ...
eeworldonline

Choosing the Right Overcurrent Protection for Next-Gen Consumer Electronic Designs

Consumer electronic products have become increasingly complex, compact, and power-dense. With these changes comes a heightened need for robust overcurrent protection strategies to ensure the safety, ...