(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...
“X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been ...
Definition: X-Ray Diffraction (XRD) is a powerful analytical technique used to characterize the atomic and molecular structure of a crystal. By measuring the angles and intensities of diffracted beams ...
Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.
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