Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, announced the successful production of the world’s first semiconductor wafer whose ...

Researchers at the National Institute of Standards and Technology (NIST) have devised a system for manipulating and precisely positioning individual nanowires Researchers at the National Institute of ...

ficonTEC’s new WaferLine Test (WLT) product line is specially designed as a versatile, fully automatable test-&-measurement system platform for wafer-level device test. They systems provide fully ...

The move to multi-die packaging is driving chipmakers to develop more cost-effective ways to ensure only known-good die are integrated into packages, because the price of failure is significantly ...

A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...

Known-good-die (KGD) sort is a commonly used technique in semiconductor processing that allows IC device engineers to bypass the packaging of defective semiconductor devices, saving time and money.

As silicon photonics costs come down, the technology is being worked into new applications, from connectivity to AI. But full commercial production requires testing those photonic circuits before ...

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order ...

With Aehr providing the first ever solution for wafer level burn-in in an AI processor in partnership with this customer and their outsourced assembly and test or OSAT partner, we have shown that our ...