Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
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