AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

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AZOM

Utilizing High Current Plasma FIB-SEM for Sample Preparation

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
technologynetworks

JEOL CRYO-FIB-SEM Enables Specimen Preparation for Cryo-Electron Microscopy

JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron ...
AZOM

History of FIB Sample Preparation for TEM Analysis

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
AZoNano

Using Advanced FIB-SEM Tomography to Characterize Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...
Optics

FIB/SEM laser paired with ablation for analysis

Zeiss’s Auriga combines Trumpf’s pulsed micro-focus laser for ablation with established FIB-SEM technology to enable “novel testing techniques”. Auriga: FIB-SEM and ablation in one. Carl Zeiss has ...