EDN

Designs with multiple clock domains: New tools avoid clock skew and reduce pattern counts

Nothing accelerates a testability engineer's receding hairline as the addition of further clock domains to the latest SoC or IC design. Avoiding clock skew during test is becoming one of the biggest ...
EDN

Design clock controllers for hierarchical test

Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...
Semiconductor Engineering

The Design Challenges Of Clock Integrity And Clock Jitter

Races, missed next-state values due to long paths, and metastability can result from corrupted clock signals. This post describes the challenges of clock network and clock jitter analysis in more ...
Semiconductor Engineering

Verification Of Multi-Clock Designs: The Bigger Picture

Yesterday’s SoCs are today’s blocks and sub-chips. The resultant combination of interfaces, protocols and performance objectives regularly results in many clock domains on a single chip. Often, this ...
Electronic Design

Reduce Power in Chip Designs with Sequential Clock Gating

Clock gating is one of the most frequently used techniques in RTL to reduce dynamic power consumption without affecting the functionality of the design. One method involves inserting gating conditions ...