Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Thermo Scientific Auto Slice and View and Maps, two automation software packages for electron/ion microscopy, are excellent for simplifying gathering common imaging techniques. However, it is rarely ...
Researchers developed a method to enhance 3D imaging of lithium-ion battery electrodes, improving visualization of internal ...
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