AZOM

Revolutionizing Cryo-Sample Preparation: High-Resolution Insights with Cryogenic FIB-SEM

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...
AZOM

The Link Between FIB-SEM and TEM

An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Hosted on MSN

Utilizing High Current Plasma FIB-SEM for Sample Preparation

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
The Scientist

The Expansion of Volume Electron Microscopy

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
AZoNano

Using Advanced FIB-SEM Tomography to Characterize Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...
Nanowerk

Introduction to Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...