Fracture and breakage of single crystals, particularly of silicon wafers, are multi-scale problems: the crack tip starts propagating on an atomic scale with the breaking of chemical bonds, forms crack ...
BUFFALO, N.Y. – A University at Buffalo study published on March 7 in Nature’s Scientific Reports describes how a new materials development technique can help meet the goals of the Materials Genome ...
Fast, precise and stable nanopositioning and metrology are critical for the development of nanoscale structures, particularly in the semiconductor industry. Present measurement techniques that offer ...
Diverse optical wafer defect inspection systems including (a) Brightfield/darkfield imaging system, (b) Dark-field imaging with null ellipsometry, (c) Through-focus scanning imaging microscopy, (d) ...
Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...
Harness the potential of factory automation with cutting-edge X-Ray diffraction technology. The Wafer XRD 300 stands as an ultra-fast, high-precision metrology module designed for crystal orientation ...
Soft X‐ray diffraction gratings coupled with advanced multilayer coatings represent a pivotal innovation in the development of high‐resolution spectroscopic instruments. These devices utilise periodic ...
Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...
Spectrogon manufactures optical interference filters, thin film coatings, and holographic diffraction gratings. The filters are used in several applications such as medical, process industry, thermal ...
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