What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

a) Supramolecular fibers observed by high-speed atomic force microscopy (HS-AFM). The yellow and blue arrows mark the positions of fiber ends during the pause phases prior to the onset of the growth ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...